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Volumn 473, Issue 1-2, 2001, Pages 128-135

A model of charge collection for irradiated p+n detectors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON TRAPS; PROTON IRRADIATION; PROTONS; SILICON;

EID: 0035500648     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01133-0     Document Type: Conference Paper
Times cited : (18)

References (22)
  • 3
    • 0037059428 scopus 로고    scopus 로고
    • Determination of effective trapping times for electrons and holes in irradiated silicon
    • Third International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices, Firenze, Italy, June 2000, in press
    • (2002) Nucl. Instr. and Meth. A
    • Kramberger, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.