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Volumn 447, Issue 1, 2000, Pages 116-125

Recent results from the RD-48 (ROSE) Collaboration

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; OXYGEN; RADIATION DETECTORS; RADIATION HARDENING; SILICON SENSORS;

EID: 0033705610     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00179-0     Document Type: Article
Times cited : (46)

References (10)
  • 3
    • 85031573664 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Hamburg
    • Michael Moll, Ph.D. Thesis, University of Hamburg, 1999.
    • (1999)
    • Moll, M.1
  • 6
    • 85031575052 scopus 로고    scopus 로고
    • Private communication, Prof. Bruno Sopko, Department of Physics, Faculty of Mechanical Engineering, CTU Prague, Czech Republic
    • Private communication, Prof. Bruno Sopko, Department of Physics, Faculty of Mechanical Engineering, CTU Prague, Czech Republic.
  • 8
    • 0006600931 scopus 로고    scopus 로고
    • Relation between microscopic defects and macroscopic changes in silicon detector properties after hadron irradiation
    • to be published
    • E. Fretwurst, M. Kuhnke, M. Moll, G. Lindström, Relation between microscopic defects and macroscopic changes in silicon detector properties after hadron irradiation, Mater. Sci. Semicond. Process., to be published.
    • Mater. Sci. Semicond. Process
    • Fretwurst, E.1    Kuhnke, M.2    Moll, M.3    Lindström, G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.