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Volumn 421, Issue 3, 1999, Pages 502-511

Carrier lifetimes in heavily irradiated silicon diodes

Author keywords

Carrier lifetime; Irradiated silicon

Indexed keywords

CHARGE CARRIERS; CURVE FITTING; EXTRAPOLATION; MATHEMATICAL MODELS; NEUTRON IRRADIATION; RADIATION EFFECTS; SEMICONDUCTOR DIODES; SILICON SENSORS;

EID: 0033079870     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01229-7     Document Type: Article
Times cited : (13)

References (20)
  • 1
    • 0347346470 scopus 로고    scopus 로고
    • CERN LHCC/97-17 ATLAS TDR 5, 30th April 1997
    • CERN LHCC/97-17 ATLAS TDR 5, 30th April 1997.
  • 2
    • 0347976765 scopus 로고
    • PhD Thesis, Interner Bericht DESY FH1K-92-01
    • R. Wunstorf, PhD Thesis, 1992, Interner Bericht DESY FH1K-92-01.
    • (1992)
    • Wunstorf, R.1
  • 3
    • 0346715999 scopus 로고
    • PhD Thesis, University of Liverpool
    • J.D. Richardson, PhD Thesis, University of Liverpool, 1995.
    • (1995)
    • Richardson, J.D.1
  • 8
    • 0347346468 scopus 로고
    • L. Cifarelli, T. Ypsilantis (Eds.), Plenum press, New York
    • P. Jarron et al., in: L. Cifarelli, T. Ypsilantis (Eds.), New Technologies for Supercolliders, Plenum press, New York, 1991, pp. 105-123.
    • (1991) New Technologies for Supercolliders , pp. 105-123
    • Jarron, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.