Charge collection efficiency in heavily irradiated silicon diodes

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 412, Issue 2-3, 1998, Pages 238-246

  Beattie, L ^a   Brodbeck, T J ^a   Chilingarov, A ^a   Hughes, G ^a   Ratoff, P ^a   Sloan, T ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

Charge collection efficiency; Irradiated silicon detectors

Indexed keywords

ALPHA PARTICLES; ELECTRON TRAPS; HOLE TRAPS; IONIZING RADIATION; NEUTRON IRRADIATION; SEMICONDUCTOR COUNTERS; SEMICONDUCTOR DIODES; SILICON SENSORS;

CHARGE COLLECTION EFFICIENCY; IRRADIATED SILICON DETECTORS;

PARTICLE DETECTORS;

EID: 0032137142     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)00469-0     Document Type: Article

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