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Volumn 443, Issue 1, 2000, Pages 148-155
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Analysis of the transient response of LED-illuminated diodes under heavy radiation damage
e
CERN
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC CURRENTS;
ELECTRIC FIELDS;
ELECTRIC POTENTIAL;
ELECTRIC SPACE CHARGE;
LIGHT EMITTING DIODES;
PROTON IRRADIATION;
RADIATION DAMAGE;
SILICON SENSORS;
SILICON DETECTORS;
PARTICLE DETECTORS;
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EID: 0034696466
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)01093-1 Document Type: Article |
Times cited : (6)
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References (6)
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