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Volumn 22, Issue 3, 2001, Pages 121-123

Fabrication of laser-annealed poly-TFT by forming a Si1-xGex thermal barrier

Author keywords

Alloy; Excimer laser annealing (ELA); Thin film transistor (TFT)

Indexed keywords

ANNEALING; EXCIMER LASERS; GERMANIUM ALLOYS; ION IMPLANTATION; POLYSILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SOLIDIFICATION; THERMAL BARRIER COATINGS; THERMAL CONDUCTIVITY;

EID: 0035280101     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.910615     Document Type: Article
Times cited : (4)

References (17)
  • 7
    • 84956259688 scopus 로고
    • Enlargement of poly-Si film grain size by excimer laser ennealing and its application to high-performance poly-Si thin film transistor
    • (1991) Jpn. J. Appl. Phys. , vol.30 , pp. 3700-3703
    • Kuriyama, H.1
  • 10
    • 0005507201 scopus 로고    scopus 로고
    • Excimer laser-induced crystallization of polycrystalline silicon films by adding oxygen
    • (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 1473-1476
    • Choi, H.-S.1
  • 15
    • 0000553102 scopus 로고    scopus 로고
    • Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors
    • (1999) J. Appl. Phys. , vol.86 , pp. 4600-4606
    • Angelis, C.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.