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Volumn 86, Issue 8, 1999, Pages 4600-4606
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Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000553102
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.371409 Document Type: Article |
Times cited : (82)
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References (18)
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