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Volumn 82, Issue 9, 1997, Pages 4303-4309

A systematic study and optimization of parameters affecting grain size and surface roughness in excimer laser annealed polysilicon thin films

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[No Author keywords available]

Indexed keywords


EID: 0037575423     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366238     Document Type: Article
Times cited : (66)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.