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Volumn 39, Issue 3 A/B, 2000, Pages
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Interface-treated Josephson junctions in trilayer structures
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ELECTRIC CONDUCTIVITY OF SOLIDS;
INTERFACES (MATERIALS);
LOW TEMPERATURE OPERATIONS;
MAGNETIC FIELDS;
MAGNETRON SPUTTERING;
PHOTOLITHOGRAPHY;
REACTIVE ION ETCHING;
SEMICONDUCTING FILMS;
SEMICONDUCTOR DEVICE STRUCTURES;
SUBSTRATES;
YTTRIUM BARIUM COPPER OXIDES;
ARGON ION ETCHING;
INTERFACE TREATMENT;
NATURAL BARRIER;
RESISTIVELY SHUNTED JUNCTION TYPE CHARACTERISTICS;
TRILAYER STRUCTURES;
JOSEPHSON JUNCTION DEVICES;
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EID: 0033734224
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.39.l205 Document Type: Article |
Times cited : (29)
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References (8)
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