High-resolution current measurement system using a high-Tc superconductor sampler

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 986-989

  Hidaka, Mutsuo ^a   Ando, Noriaki ^a   Satoh, Tetsuro ^a   Tahara, Shuichi ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Current measurement; High Tc superconductor; Sampler; SFQ circuit

Indexed keywords

CRYOGENICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC WAVEFORMS; HIGH TEMPERATURE SUPERCONDUCTORS; INDUCTANCE; MAGNETIC FIELDS; MAGNETOMETERS; MICROPROCESSOR CHIPS; MICROSTRIP LINES; SQUIDS; SUBSTRATES; VACUUM APPLICATIONS;

COMPARATOR JUNCTION; HIGH RESOLUTION CURRENT MEASUREMENT SYSTEM; HIGH TEMPERATURE SUPERCONDUCTOR SAMPLER; PULSE TUBE CRYOCOOLER; SUPERCONDUCTING LOOP; VACUUM CHAMBER;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);

EID: 0035267928     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919514     Document Type: Conference Paper

References (9)

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6. Balanced comparator fabricated in ramp edge technology
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8. 7-x ground plane
9. High-Tc superconductor sampler system for digital signal waveform measurement