Interface-engineered YBCO edge junctions

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3358-3361

  Moeckly, Brian H ^a   Char, Kookrin ^a   Huang, Yi ^b   Merkje, Karl L ^c  

^a Conductus Inc ^*  (United States)

^b Seoul National University   (South Korea)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIGITAL CIRCUITS; HIGH TEMPERATURE SUPERCONDUCTORS; INTERFACES (MATERIALS); MAGNETIC FIELDS; MICROSTRUCTURE; MICROWAVES; OXIDE SUPERCONDUCTORS; TRANSMISSION ELECTRON MICROSCOPY;

EDGE JUNCTIONS; HIGH TEMPERATURE CIRCUIT TECHNOLOGY; ION PLASMA TREATMENTS; JUNCTION INTERFACE; VACUUM ANNEALING;

JOSEPHSON JUNCTION DEVICES;

EID: 0032681388     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783749     Document Type: Article

References (8)

1. K. L. Merkle, Y. Huang, S. Rozeveld, K. Char, and B. H. Moeckly, "Electron microscopy of high-Tc Josephson junctions formed in the epitaxial layer ramp-edge geometry. YBCO/barrier/YBCO," submitted to Micron, 1999, and references therein.
2. K. Char, L. Antognazza, and T. H. Geballe, Appl. Phys. Lett., vol. 65, pp. 904,1994.
3. L. Antognazza, B. H. Moeckly, T. H. Geballe, and K. Char, "Properties of high-Tc Josephson junctions with a Y0.7Ca0.3Ba2Cu3O7-d barrier layer," Phys. Rev. B, vol. 52, pp. 4559, 1995.
4. B. H. Moeckly and K.Char, "Properties of interface engineered high Tc Josephson junctions," Appl. Phys. Lett., vol. 71, pp. 2526, 1997.
5. B. H. Moeckly, K. Char, Y. Huang, and K. L. Merkle, "Interfaceengineered high-Tc Josephson junctions," Appl. Supercon., 1998.
6. Y. M. Zhang, D. Winkler, P.-A. Nilsson, and T. Claeson, "Josephson flux-flow resonances in overdamped long YBa2cu3Oy grain-boundary junctions," Phys. Rev. B, vol. 51, pp. 8684, 1995.
7. A. Barone and G. Paternb, Physics and Applications of the Josephson Effect. New York: Wiley, 1982.
8. Y. Huang, K. L. Merkle, B. H. Moeckly, and K. Char, "The effect of microstructure on the electrical properties of the YBCO interfaceengineered Josephson junctions," unpublished.