Long term stability of ybco-based josephson junctions

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3382-3385

  Vale, Leila R ^a   Ono, R H ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CRITICAL CURRENTS; ELECTRIC RESISTANCE; ELECTROCHEMICAL ELECTRODES; ELECTRON DEVICE MANUFACTURE; OXIDE SUPERCONDUCTORS; SPUTTER DEPOSITION; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES;

BICRYSTAL JUNCTIONS; EPITAXIAL INSULATOR; STEP EDGE JUNCTIONS; SUPERCONDUCTOR NORMAL METAL SUPERCONDUCTOR JUNCTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 0032690528     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783755     Document Type: Article

References (11)

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