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Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 3, 2001, Pages 352041-352047

X-ray and neutron scattering study of Si-rich Si-Ge single crystals

(5) Le Bolloc'h D a,d Robertson, J L b Reichert, H c Moss, S C a Crow, M L b

a University of Houston (United States)

b OAK RIDGE NATIONAL LABORATORY (United States)

c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

d EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; SILICON;

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLIZATION; FILM; MEASUREMENT; NEUTRON SCATTERING; RADIATION SCATTERING; X RAY;

EID: 0035130917 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.63.035204 Document Type: Article

Times cited : (4)

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