Novel microscopic properties and the electronic structure of SiGe heterostructures and related systems

Thin Solid Films

Volumn 294, Issue 1-2, 1997, Pages 166-172

  Shaw, M J ^a   Briddon, P R ^a   Jaros, M ^a  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

Electronic structure; Germanium; Heterostructures; Microscopic properties; Silicon

Indexed keywords

CALCULATIONS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING FILMS; SEMICONDUCTING GERMANIUM COMPOUNDS;

HETEROSTRUCTURES; PSEUDOPOTENTIAL CALCULATIONS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0031071170     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09255-3     Document Type: Article

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