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Volumn 86, Issue 3, 1999, Pages 1292-1297

Evolution of mosaic structure in Si0.7Ge0.3 epilayers grown on Si(001) substrates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000277363     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370884     Document Type: Article
Times cited : (15)

References (19)
  • 19
    • 85034549452 scopus 로고    scopus 로고
    • note
    • As the dislocations are usually not regularly spaced, there may still exist some less distorted regions in the film even when this criterion is fulfilled.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.