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Volumn 11, Issue 3, 2001, Pages
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In situ characterization of atomic layer deposition of SrTiO3
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CRYSTALS;
MASS SPECTROMETERS;
PHYSICAL VAPOR DEPOSITION;
QUARTZ;
STRONTIUM COMPOUNDS;
TITANIUM DIOXIDE;
WATER;
ATOMIC LAYER DEPOSITION (ALD);
THIN FILMS;
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EID: 0034848603
PISSN: 11554339
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1051/jp4:20013115 Document Type: Conference Paper |
Times cited : (15)
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References (25)
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