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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 24, 2000, Pages 16893-16899

Measurement of the dielectric constant of amorphous CNx films in the 0-45 eV energy range

(6) Barreca, F a Mezzasalma, A M a Mondio, G a Neri, F a Trusso, S a Vasi, C a

a INFM (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; GRAPHITE; NITROGEN DERIVATIVE;

ARTICLE; CRYSTAL STRUCTURE; DIELECTRIC CONSTANT; ELASTICITY; ELECTRON; ENERGY; FILM; LASER; SPECTROSCOPY;

EID: 0034670788 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.16893 Document Type: Article

Times cited : (16)

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