Structure and morphology of SiC surfaces studied by LEED, AES, HREELS and STM

Diamond and Related Materials

Volumn 6, Issue 10, 1997, Pages 1349-1352

  Starke, U ^a   Bernhardt, J ^a   Franke, M ^a   Schardt, J ^a   Heinz, K ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Low energy electron diffraction; Morphology; Silicon carbide; Surface structure

Indexed keywords

EID: 0005253945     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(97)00090-3     Document Type: Article

References (11)

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8. J. Schardt, U. Starke, J. Bernhardt, K. Heinz, Surf. Rev. Lett. accepted.
9. U. Starke, J. Schardt, M. Franke, Appl. Phys. A, accepted.
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11. H. Matsunami, private communication.