Morphology, bond saturation and reconstruction of hexagonal SiC surfaces

Applied Physics A: Materials Science and Processing

Volumn 65, Issue 6, 1997, Pages 587-596

  Starke, U ^a   Schardt, J ^a   Franke, M ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL BONDS; GEOMETRY; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SATURATION (MATERIALS COMPOSITION); SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; SURFACE STRUCTURE;

BOND SATURATION; CHEMICAL TREATMENT; HEXAGONAL ORIENTATION; SURFACE RECONSTRUCTION;

SURFACES;

EID: 0031359967     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050626     Document Type: Article

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