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Volumn 147, Issue 7, 2000, Pages 2685-2692

Comprehensive model for the gettering of lifetime-killing impurities in silicon

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL IMPURITIES; CRYSTAL LATTICES; MATHEMATICAL MODELS; PHOSPHORUS; POINT DEFECTS;

EID: 0034226997     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1393590     Document Type: Article
Times cited : (38)

References (38)
  • 7
    • 0006178014 scopus 로고
    • Semiconductor Silicon (1994)
    • H. R. Huff, W. Bergholz, and K. Sumino, Editors, PV 94-10, Pennington, NJ
    • D. Gilles and H. Ewe, in Semiconductor Silicon (1994), H. R. Huff, W. Bergholz, and K. Sumino, Editors, PV 94-10, p. 772, The Electrochemical Society Proceedings Series, Pennington, NJ (1994).
    • (1994) The Electrochemical Society Proceedings Series , pp. 772
    • Gilles, D.1    Ewe, H.2
  • 8
  • 34
    • 0031383530 scopus 로고    scopus 로고
    • Materials Research Society, Pittsburgh, PA
    • S. A. McHugo and M. Imaizumi, in Symposium Proceedings, Vol. 469, Materials Research Society, Pittsburgh, PA, p. 487 (1997).
    • (1997) Symposium Proceedings , vol.469 , pp. 487
    • McHugo, S.A.1    Imaizumi, M.2
  • 35
    • 0031374596 scopus 로고    scopus 로고
    • Materials Research Society, Pittsburgh, PA
    • I. Perichaud and S. Martinuzzi, in Symposium Proceedings, Vol. 469, Materials Research Society, Pittsburgh, PA, p. 493 (1997).
    • (1997) Symposium Proceedings , vol.469 , pp. 493
    • Perichaud, I.1    Martinuzzi, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.