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Volumn 39, Issue 7 A, 2000, Pages 3919-3923

Dehydration after plasma oxidation of porous low-dielectric-constant spin-on-glass films

Author keywords

HMDS; Low dielectric constant material; Plasma; Spin on glass

Indexed keywords

COATING TECHNIQUES; DEHYDRATION; GLASS; ORGANIC COMPOUNDS; OXIDATION; OXYGEN; PERMITTIVITY; PLASMAS; POROSITY; POROUS MATERIALS; SILICON WAFERS;

EID: 0034215919     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3919     Document Type: Article
Times cited : (25)

References (13)
  • 2
    • 0031256462 scopus 로고    scopus 로고
    • N. P. Hacker: MRS Bull. 22 (1997) No. 10, 33.
    • (1997) MRS Bull. , vol.22 , Issue.10 , pp. 33
    • Hacker, N.P.1
  • 8
    • 0031256187 scopus 로고    scopus 로고
    • K. Endo: MRS Bull. 22 (1997) No. 10, 55.
    • (1997) MRS Bull. , vol.22 , Issue.10 , pp. 55
    • Endo, K.1
  • 12
    • 19644389782 scopus 로고
    • Proc. 3rd int. symp. ultra large scale integration science and technology
    • Electrochemical Society, Pennington, NJ
    • C. H. Ting: Proc. 3rd Int. Symp. Ultra Large Scale Integration Science and Technology (Electrochemical Society, Pennington, NJ, 1991) Electrochem. Soc. Proc. Vol. 91-11, p. 592.
    • (1991) Electrochem. Soc. Proc. , vol.91 , Issue.11 , pp. 592
    • Ting, C.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.