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Volumn 31, Issue 6, 2000, Pages 397-403

Surface layer effective density-of-states (SLEDOS) and its applications in MOS devices modeling

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; ITERATIVE METHODS; QUANTUM THEORY; SEMICONDUCTOR DEVICE MODELS; THRESHOLD VOLTAGE;

EID: 0033729326     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(00)00041-0     Document Type: Article
Times cited : (1)

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    • in press
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.