Quantum effects upon drain current in a biased MOSFET

IEEE Transactions on Electron Devices

Volumn 45, Issue 10, 1998, Pages 2213-2221

  Ip, Brian K ^a   Brews, John R ^a  

^a University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; GATES (TRANSISTOR); PARTIAL DIFFERENTIAL EQUATIONS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING;

DRAIN CURRENTS; POISSON'S EQUATION; SCHRODINGER EQUATION;

MOSFET DEVICES;

EID: 0032188387     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.725256     Document Type: Article

References (13)

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