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Volumn 38, Issue 10 B, 1999, Pages
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Correlation between dislocation density and the macroscopic properties of GaN grown by metalorganic vapor phase epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER MOBILITY;
DISLOCATIONS (CRYSTALS);
ETCHING;
FILM GROWTH;
METALLORGANIC VAPOR PHASE EPITAXY;
PHOTOELECTRICITY;
PHOTOLUMINESCENCE;
SEMICONDUCTING FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
DISLOCATION DENSITY;
GALLIUM NITRIDE;
PHOTOELECTROCHEMICAL ETCHING;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0033339264
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.l1159 Document Type: Article |
Times cited : (16)
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References (16)
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