Nanomechanical basis for imaging soft materials with tapping mode atomic force microscopy

Journal of Applied Physics

Volumn 79, Issue 4, 1996, Pages 1885-1890

  Howard, A J ^a,b   Rye, R R ^a   Houston, J E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b EMCORE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001690447     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361090     Document Type: Article

References (16)

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