-
3
-
-
0004306227
-
-
John Wiley & Sons, New York
-
nd ed., 285 (John Wiley & Sons, New York, 1995)
-
(1995)
nd Ed.
, pp. 285
-
-
Prince, B.1
-
4
-
-
0031139365
-
-
K. Itoh, Y. Nakagome, S. Kimura, and T. Watanabe, IEEE J. Solid State Cir. 32, 624 (1997)
-
(1997)
IEEE J. Solid State Cir.
, vol.32
, pp. 624
-
-
Itoh, K.1
Nakagome, Y.2
Kimura, S.3
Watanabe, T.4
-
6
-
-
0026896296
-
-
H. Geib, W. Weber, E. Wohlrab, and L. Risch, IEEE J. Solid State Cir. 27, 1028 (1992)
-
(1992)
IEEE J. Solid State Cir.
, vol.27
, pp. 1028
-
-
Geib, H.1
Weber, W.2
Wohlrab, E.3
Risch, L.4
-
8
-
-
33751124349
-
-
R.E. Jones, Jr., S. Zafar, B. White, B. Jiang, B.M. Melnick, P. Zurcher, P. Chu, D. Taylor, T.P. Remmel, and S.J. Gillespie, Electrochemical Society Proceedings, 98-3, 196 (1998)
-
(1998)
Electrochemical Society Proceedings
, vol.98
, Issue.3
, pp. 196
-
-
Jones Jr., R.E.1
Zafar, S.2
White, B.3
Jiang, B.4
Melnick, B.M.5
Zurcher, P.6
Chu, P.7
Taylor, D.8
Remmel, T.P.9
Gillespie, S.J.10
-
11
-
-
33751134333
-
-
K. One, T. Horikawa, T. Shibano, N. Mikami, T. Kuroiwa, and T. Kawahara, IEDM-98, 301 (1998)
-
(1998)
IEDM-98
, pp. 301
-
-
One, K.1
Horikawa, T.2
Shibano, T.3
Mikami, N.4
Kuroiwa, T.5
Kawahara, T.6
-
12
-
-
33751128154
-
-
K.P. Muller, B. Flietner, C.L. Hwang, R.L. Kleinhenz, T. Nakao, R.Ranade, Y. Tsunashima, and T. Mii, IEDM-96 Proceedings, 507 (1996).
-
(1996)
IEDM-96 Proceedings
, pp. 507
-
-
Muller, K.P.1
Flietner, B.2
Hwang, C.L.3
Kleinhenz, R.L.4
Nakao, T.5
Ranade, R.6
Tsunashima, Y.7
Mii, T.8
-
13
-
-
84954191552
-
-
S. Kamiyama, T. Saeki, H. Mori, and Y. Numasawa, IEDM 91, 827 (1991)
-
(1991)
IEDM 91
, pp. 827
-
-
Kamiyama, S.1
Saeki, T.2
Mori, H.3
Numasawa, Y.4
-
14
-
-
0031234721
-
-
C. Bascari, S.K. Streiffer, A.I. Kingon, and R. Waser, J. Appl. Phys. 82, 2497 (1997)
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 2497
-
-
Bascari, C.1
Streiffer, S.K.2
Kingon, A.I.3
Waser, R.4
-
15
-
-
21544465073
-
-
S. Zafar, R.E. Jones, Jr., P. Chu, B. White, B. Jiang, D. Taylor, P. Zurcher, and S.J. Gillespie, Appl. Phys. Lett. 72, 2820 (1998)
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 2820
-
-
Zafar, S.1
Jones Jr., R.E.2
Chu, P.3
White, B.4
Jiang, B.5
Taylor, D.6
Zurcher, P.7
Gillespie, S.J.8
-
17
-
-
0032066675
-
-
A.Yamazaki, T. Yamagata, Y. Arita, M. Taniguchi, and M. Yamada, IEICE Trans. Electron., E81-C, 750 (1998).
-
(1998)
IEICE Trans. Electron.
, vol.E81-C
, pp. 750
-
-
Yamazaki, A.1
Yamagata, T.2
Arita, Y.3
Taniguchi, M.4
Yamada, M.5
-
18
-
-
0029406986
-
-
T. Yamagata, S. Tomishima, M.Tsukude, T.Tsurudu, Y.Hashizume, and K.Arimoto, IEEE J. Solid State Cir. 30, 1183 (1995).
-
(1995)
IEEE J. Solid State Cir.
, vol.30
, pp. 1183
-
-
Yamagata, T.1
Tomishima, S.2
Tsukude, M.3
Tsurudu, T.4
Hashizume, Y.5
Arimoto, K.6
-
19
-
-
0031351319
-
-
T-S. Chen, V. Balu, B. Jiang, S-H. Kuah, J.C. Lee, P.Y. Chu, R.E. Jones, Jr., P. Zurcher, D.J. Taylor, and S.J. Gillespie, Integrated Ferroelectrics, 16, 191 (1997)
-
(1997)
Integrated Ferroelectrics
, vol.16
, pp. 191
-
-
Chen, T.-S.1
Balu, V.2
Jiang, B.3
Kuah, S.-H.4
Lee, J.C.5
Chu, P.Y.6
Jones Jr., R.E.7
Zurcher, P.8
Taylor, D.J.9
Gillespie, S.J.10
-
20
-
-
0029371576
-
-
K. Takemura, S. Yamamichi, P-Y. Lesaicherre, K. Tokashiki, H. Miyamoto, H. Ono, Y. Miyasaka, and M. Yoshida, Jpn. J. Appl. Phys., 34, 5224 (1995)
-
(1995)
Jpn. J. Appl. Phys.
, vol.34
, pp. 5224
-
-
Takemura, K.1
Yamamichi, S.2
Lesaicherre, P.-Y.3
Tokashiki, K.4
Miyamoto, H.5
Ono, H.6
Miyasaka, Y.7
Yoshida, M.8
-
21
-
-
0031268461
-
-
T. Kawakubo, K. Abe, S. Komatsu, K. Sano, N. Yanase, H. Mochizuki, IEEE Elect. Dev. Lett. 18, 529 (1997)
-
(1997)
IEEE Elect. Dev. Lett.
, vol.18
, pp. 529
-
-
Kawakubo, T.1
Abe, K.2
Komatsu, S.3
Sano, K.4
Yanase, N.5
Mochizuki, H.6
-
22
-
-
0000928875
-
-
P.J. Pokela, J.S. Reid, C. Kwok, E. Kolawa, M-A. Nicolet, J. Appl. Phys. 70, 2828 (1991)
-
(1991)
J. Appl. Phys.
, vol.70
, pp. 2828
-
-
Pokela, P.J.1
Reid, J.S.2
Kwok, C.3
Kolawa, E.4
Nicolet, M.-A.5
-
23
-
-
0031176096
-
-
S. Yamamichi, P. Lesaicherre, H. Yamaguchi, K. Takemura, S. Sone, H. Yabuta, K. Sato, T. Tamura, K. Nakajima, S. Ohnishi, K. Tokashiki, Y. Hayashi, Y. Kato, Y. Miyasaka, M. Yoshida, H. Ono, IEEE Trans. Elect. Dev. 44, 1076 (1997)
-
(1997)
IEEE Trans. Elect. Dev.
, vol.44
, pp. 1076
-
-
Yamamichi, S.1
Lesaicherre, P.2
Yamaguchi, H.3
Takemura, K.4
Sone, S.5
Yabuta, H.6
Sato, K.7
Tamura, T.8
Nakajima, K.9
Ohnishi, S.10
Tokashiki, K.11
Hayashi, Y.12
Kato, Y.13
Miyasaka, Y.14
Yoshida, M.15
Ono, H.16
-
24
-
-
17544394633
-
-
B.E. White, P.Y. Chu, S. Zafar, V. Balu, D. Gentile, R.E. Jones, B. Jiang, B.M. Melnick, D.J. Taylor, P. Zurcher, and S.J. Gillespie, Mat. Res. Soc. Symp. Proc. 493, 165 (1998)
-
(1998)
Mat. Res. Soc. Symp. Proc.
, vol.493
, pp. 165
-
-
White, B.E.1
Chu, P.Y.2
Zafar, S.3
Balu, V.4
Gentile, D.5
Jones, R.E.6
Jiang, B.7
Melnick, B.M.8
Taylor, D.J.9
Zurcher, P.10
Gillespie, S.J.11
-
26
-
-
0030421779
-
-
Y. Kato, H. Yabuta, S. Sone, H. Yamaguchi, T. Iizuka, S. Yamamichi, P. Lesaicherre, S. Nishimoto, and Y.Yoshida, Mat. Res. Soc. Symp. Proc., 433, 3 (1996)
-
(1996)
Mat. Res. Soc. Symp. Proc.
, vol.433
, pp. 3
-
-
Kato, Y.1
Yabuta, H.2
Sone, S.3
Yamaguchi, H.4
Iizuka, T.5
Yamamichi, S.6
Lesaicherre, P.7
Nishimoto, S.8
Yoshida, Y.9
-
27
-
-
0001574075
-
-
S. Zafar, R.E. Jones, B. Jiang, B.E. White, V. Kaushik, and S.J. Gillespie, Appl. Phys. Lett. 73, 3533 (1998)
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 3533
-
-
Zafar, S.1
Jones, R.E.2
Jiang, B.3
White, B.E.4
Kaushik, V.5
Gillespie, S.J.6
-
28
-
-
84887826529
-
-
J.F. Scott, M. Azuma, E. Fujii, T. Otsuki, G. Kano, M.C. Scott, C.A. Paz de Araujo, L.D. McMillan, and T. Roberts, Proc. 1992 IEEE Intern. Symp. Appl. Ferroelectrics, 356 (1992)
-
(1992)
Proc. 1992 IEEE Intern. Symp. Appl. Ferroelectrics
, pp. 356
-
-
Scott, J.F.1
Azuma, M.2
Fujii, E.3
Otsuki, T.4
Kano, G.5
Scott, M.C.6
Paz De Araujo, C.A.7
McMillan, L.D.8
Roberts, T.9
-
29
-
-
0004359684
-
-
G.W. Dietz, W. Antpohler, M. Klee, and R. Waser, J. Appl. Phys. 78, 1 (1995)
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 1
-
-
Dietz, G.W.1
Antpohler, W.2
Klee, M.3
Waser, R.4
-
30
-
-
0029370884
-
-
T. Horikawa, T. Makita, T.Kuroiwa, and N. Mikami, Jpn. J. Appl. Phys. 34, 5478 (1995)
-
(1995)
Jpn. J. Appl. Phys.
, vol.34
, pp. 5478
-
-
Horikawa, T.1
Makita, T.2
Kuroiwa, T.3
Mikami, N.4
-
31
-
-
0029754601
-
-
S.K. Streiffer, C. Basceri, A.I. Kingon, S. Lipa, S. Bilodeau, R. Carl, and P.C. Van Burkirk, Mat. Res. Soc. Symp. Proc. 415, 219 (1996)
-
(1996)
Mat. Res. Soc. Symp. Proc.
, vol.415
, pp. 219
-
-
Streiffer, S.K.1
Basceri, C.2
Kingon, A.I.3
Lipa, S.4
Bilodeau, S.5
Carl, R.6
Van Burkirk, P.C.7
-
34
-
-
33751122546
-
-
Abstracts
-
S. Zafar, R.E. Jones, B. Hradsky, D. Gentile, T-L. Tsai, P. Zurcher, and S.J. Gillespie, MRS '98 Fall Meeting, Abstracts p. 289 (1998)
-
(1998)
MRS '98 Fall Meeting
, pp. 289
-
-
Zafar, S.1
Jones, R.E.2
Hradsky, B.3
Gentile, D.4
Tsai, T.-L.5
Zurcher, P.6
Gillespie, S.J.7
-
35
-
-
0025448039
-
-
R. Waser, T. Baiatu, and K-H. Hardtl, J. Am. Ceram. Soc., 73, 1645 (1990)
-
(1990)
J. Am. Ceram. Soc.
, vol.73
, pp. 1645
-
-
Waser, R.1
Baiatu, T.2
Hardtl, K.-H.3
-
36
-
-
0025449170
-
-
R. Waser, T. Baiatu, and K-H. Hardtl, J. Am. Ceram. Soc., 73, 1654 (1990)
-
(1990)
J. Am. Ceram. Soc.
, vol.73
, pp. 1654
-
-
Waser, R.1
Baiatu, T.2
Hardtl, K.-H.3
-
37
-
-
0025448040
-
-
T. Baiatu, R. Waser, and K-H. Hardtl, J. Am. Ceram. Soc., 73, 1663 (1990)
-
(1990)
J. Am. Ceram. Soc.
, vol.73
, pp. 1663
-
-
Baiatu, T.1
Waser, R.2
Hardtl, K.-H.3
|