Degradation in (Ba,Sr)TiO3 thin films under DC and dynamic stress conditions

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1997, Pages 82-89

  Horikawa, T ^a   Kawahara, T ^a   Yamamuka, M ^a   Ono, K ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; COMPOSITION EFFECTS; DEGRADATION; DIELECTRIC PROPERTIES OF SOLIDS; DIELECTRIC RELAXATION; ELECTRIC BREAKDOWN OF SOLIDS; HOT CARRIERS; LEAKAGE CURRENTS; RANDOM ACCESS STORAGE; STOICHIOMETRY; STRESSES;

DYNAMIC STRESS CONDITIONS;

SEMICONDUCTING FILMS;

EID: 0030647643     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)