Neutron induced soft errors in cmos memories under reduced bias

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2921-2928

  Hazucha, Peter ^a,b   Johansson, Karin ^b   Svensson, Christer ^b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b SAAB AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

NEUTRON IRRADIATION; RADIATION EFFECTS;

SINGLE EVENT UPSETS (SEU);

CMOS INTEGRATED CIRCUITS;

EID: 0032319595     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736548     Document Type: Article

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