Impact of Aging on Radiation Hardness

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2040-2047

  Shaneyfelt, M R ^a   Winokur, P S ^b   Fleetwood, D M ^b   Hash, G L ^a   Schwank, J R ^b   Sexton, F W ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b RLP Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; IRRADIATION; MICROELECTRONICS; MILITARY ELECTRONIC COUNTERMEASURES; ORDNANCE; RANDOM ACCESS STORAGE; THERMAL EFFECTS; THERMAL STRESS;

HARDNESS ASSURANCE TESTS; RADIATION HARDNESS;

RADIATION HARDENING;

EID: 0031355641     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658987     Document Type: Article

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