Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 17, Issue 11, 1998, Pages 1200-1210

  Konuk, Haluk ^a,b   Joel Ferguson, F ^a,b  

^a HEWLETT PACKARD COMPANY   (United States)

^b NONE

Author keywords

Integrated circuit testing; Logic circuit testing; Semiconductor defects

Indexed keywords

CIRCUIT OSCILLATIONS; CRYSTAL DEFECTS; INTEGRATED CIRCUIT TESTING; LOGIC GATES; MICROPROCESSOR CHIPS;

LOGIC CIRCUIT TESTING;

CMOS INTEGRATED CIRCUITS;

EID: 0032206170     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.736192     Document Type: Article

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