Testing oriented analysis of CMOS ICS with opens

Volumn , Issue , 1988, Pages 344-347

  Maly, Wojciech ^a   Nag, Pranab K ^a   Nigh, Phil ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING--MATHEMATICAL MODELS; TRANSISTORS, FIELD EFFECT--TESTING;

CMOS IC; CMOS TRANSISTOR; OPEN FAULTS; STATIC CIRCUITS; TESTING ORIENTED ANALYSIS;

INTEGRATED CIRCUITS, VLSI;

EID: 0024169186     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)