Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 3, 1998, Pages 1487-1493

  Melinger, J S ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; LASER PULSES; LASER TUNING; MICROELECTRONICS; NETWORKS (CIRCUITS); SEMICONDUCTOR DEVICES;

CHARGE COLLECTION; SEMICONDUCTOR ABSORPTION SPECTRUM; SINGLE EVENT UPSETS; VARIABLE LENGTH LASER GENERATED CHARGE TRACKS;

PULSED LASER APPLICATIONS;

EID: 0032098723     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685228     Document Type: Article

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