Charge collection from focussed picosecond laser pulses

IEEE Transactions on Nuclear Science

Volumn 35, Issue 6, 1988, Pages 1517-1522

  Buchner, S ^a   Knudson, A ^b   Kang, K ^a   Campbell, A B ^b  

^a LOCKHEED MARTIN   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; LASER PULSES; SEMICONDUCTOR DEVICES, MOS;

PICOSECOND LASER PULSES; SINGLE EVENT UPSETS;

INTEGRATED CIRCUITS;

EID: 0024172398     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25490     Document Type: Article

References (11)

1. S.P. Buchner, D. Wilson, K. Kang, D. Gill, J.A. Mazer, W.D. Raburn, A.B. Campbell, and A.R. Knudson, “Laser Simultion of Single Event Upsets,” IEEE Trans. Nucl. Sci., NS-34, 1228 (1987).
2. R.N. Hamm, J.E. Turner, H.A. Wright, and R.H. Ritchie, “Heavy-Ion Track Structure in Silicon,” IEEE Trans. Nucl. Sci., NS-26, 4892 (1979).
3. J. Bradford, “Nonequilibrium Radiation Effects In VLSI,” IEEE Trans Nucl. Sci., NS-25, 1144 (1978).
4. R.S. Wagner, N. Bordes, J.M. Bradley, C.J. Maggiore, A.R. Knudson, and A.B. Campbell, “Alpha, Boron, Silicon Ion-Induced Current Transients in Low-Capacitance Silicon and GaAs Diodes,” IEEE Trans. Nucl. Sci., NS-35 (1988).
5. F.B. McLean and T.R. Oldham, “Charge Funneling in n and p-Type Si Substrates,” IEEE Trans. Nucl. Sci., NS-29, 2018 (1982).
6. A.R. Knudson, A.B. Campbell, P. Shapiro, W.J. Stapor, E.A. Wolicki, E.L. Petersen, S.E. Diehl-Nagle, J. Hauser, and P.V. Dressendorfer, “Charge Collection in Multilayer layer Structures,” IEEE Trans. Nucl. Sci., NS-31, 1149 (1984).
7. J.R. Hauser, S.E. Diehl-Nagle, A.R. Knudson, A.B. Campbell, W.J. Stapor, and P. Shapiro, “Ion Track Shunt Effects in Multi-Junction Structures,” IEEE Trans. Nucl. Sci., NS-32, 4115 (1985).
8. A.R. Knudson, A.B. Campbell, J.R. Hauser, M. Jessee, W.J. Stapor, and P. Shapiro, “Charge Transport by the Ion Shunt Effect,” IEEE Trans. Nucl. Sci. NS-33, 1560 (1986).
9. A.R. Knudson and A.B. Campbell, “Charge Collection in Bipolar Transistors,” IEEE Trans. Nucl. Sci., NS-34, 1246 (1987).
10. J.S. Fu, C.L. Axness, and H.T. Weaver, “Two-Dimensional Simulation of Single Event Bipolar Current in CMOS Structures,” IEEE Trans. Nucl. Sci. NS-31, 1155 (1984).
11. A.R. Knudson and A.B. Campbell, “Use of an Ion Microbeam to Study SEU in Microcircuits,” IEEE Trans. Nucl. Sci., NS-28, 4017 (1981).