Spatial and temporal dependence of SEU in a 64K SRAM

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 1630-1635

  Buchner, Stephen ^a   Kang, Keith ^a   Stapor, W J ^b   Rivet, Steve ^c  

^a LOCKHEED MARTIN   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c INTERSIL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957227889     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211345     Document Type: Article

References (7)

1. S. Buchner, K. Kang, W.J. Stapor, A.B. Campbell, A.R. Knudson, P. McDonald, and S. Rivet, “Pulsed Laser-Induced SEU in Integrated Circuits: A Practical Method for Hardness Assurance Testing,” IEEE Trans. Nucl. Sci. 37, 1825 (Dec. 1990).
2. E.L. Petersen, P. Shapiro, J.H. Adams, and E.A. Burke, “Calculaton of Cosmic Ray-Induced Soft Upsets and Scaling in VLSI Devices,” IEEE Trans. Nucl. Sci., NS-29, 2055 (Dec 1982).
3. E. Petersen, “Review and Examination of Some Basic SEE Topics,” Presented at VIIIth Single Event Effects Symposium, 8th April, 1992, Los Angeles, Ca.
4. D.K. Nichols, L.S. Smith, H.R. Schwartz, G. Soli, K. Watson, R. Koga, W.R. Crain, K.B. Crawford, S.J. Hansel, and D.D. Lau, “Update on Parts SEE Susceptibility from Heavy Ions,” IEEE Trans. Nucl. Sci. NS-38, 1529 (1991).
5. R. Schneiderwind, D. Krening, S. Buchner, K. Kang, and T. Weatherford, “Laser Confirmation of SEU Experiments in GaAs MESFET Combinational Logic,” Presented this Conference.
6. A.R. Knudson, A.B. Campbell, J. R. Hauser, M. Jessee, W.J. Stapor, and P. Shapiro, “Charge Transport by the Ion Shunt Effect,” IEEE Trans. Nucl. Sci., NS-33 1560 (Dec. 1986).
7. L.W. Massengill and S.E. Diehl-Nagle, “Transient Radiation Upset Simulations of CMOS Memory Circuits,” IEEE Trans. Nucl. Sci. NS-31 1337 (Dec 1984).