Interface, surface and bulk anisotropies of heterostructures

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 544-551

  Yasuda, T ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

Anisotropy; Gan; Interface; Reflectance difference spectroscopy (rds); Sio2 si; Znse

Indexed keywords

ANISOTROPY; CRYSTAL LATTICES; CRYSTALLINE MATERIALS; ELECTRON ENERGY LEVELS; INTERFACES (MATERIALS); LIGHT REFLECTION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SEMICONDUCTING ZINC COMPOUNDS; SILICA; SPECTROSCOPIC ANALYSIS;

REFLECTANCE DIFFERENCE SPECTROSCOPY (RDS);

HETEROJUNCTIONS;

EID: 0032001364     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00881-X     Document Type: Article

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