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Volumn 14, Issue 4, 1996, Pages 3052-3057

In situ characterization of ZnSe/GaAs(100) interfaces by reflectance difference spectroscopy
[No Author Info available]

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EID: 24644438273     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (29)

References (15)
  • 2
    • 0343741495 scopus 로고
    • edited by M. H. Francombe and J. L. Vossen Academic, San Diego
    • B. Drevvillon and V. Yakovlev, Physics of Thin Films, edited by M. H. Francombe and J. L. Vossen (Academic, San Diego, 1994), Vol. 19, p. 2.
    • (1994) Physics of Thin Films , vol.19 , pp. 2
    • Drevvillon, B.1    Yakovlev, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.