메뉴 건너뛰기




Volumn 45, Issue 1, 1998, Pages 230-238

Modeling electron and hole transport with full-band structure effects by means of the spherical-harmonics expansion of the BTE

Author keywords

Boltzmann Equation; Scattering mechanisms; Semiconductor device modeling; Spherical Harmonics Expansion

Indexed keywords

BAND STRUCTURE; CHARGE CARRIERS; ELECTRON TRANSPORT PROPERTIES; HARMONIC ANALYSIS; IONIZATION OF SOLIDS; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MODELS;

EID: 0031647347     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.658836     Document Type: Article
Times cited : (79)

References (26)
  • 1
    • 0026140198 scopus 로고    scopus 로고
    • A physics-based analytical/numerical solution to the Boltzmann transport equation for use in device simulation, vol. 34, no. 4, pp. 389-396, 1991.
    • N. Goldsman, L. Henrickson, and J. Frey, A physics-based analytical/numerical solution to the Boltzmann transport equation for use in device simulation, Solid-State Electron., vol. 34, no. 4, pp. 389-396, 1991.
    • Solid-State Electron.
    • Goldsman, N.1    Henrickson, L.2    Frey, J.3
  • 2
    • 33747685975 scopus 로고    scopus 로고
    • Modeling impact-ionization in the framework of the spherical-harmonics expansion of the Boltzmann transport equation with full-band structure effects, in 6th SISDEP Conf., 1995, vol. 6, pp. 416-119.
    • M. C. Vecchi and M. Rudan, Modeling impact-ionization in the framework of the spherical-harmonics expansion of the Boltzmann transport equation with full-band structure effects, in Proc. 6th SISDEP Conf., 1995, vol. 6, pp. 416-119.
    • Proc.
    • Vecchi, M.C.1    Rudan, M.2
  • 3
    • 0029359452 scopus 로고    scopus 로고
    • Deterministic MOSFET simulation using a generalized spherical harmonic expansion of the Boltzmann equation, vol. 38, no. 8, pp. 1485-1495, 1995.
    • K. A. Hennacy, Y. J. Wu, N. Goldsman, and I. D. Meiergoyz, Deterministic MOSFET simulation using a generalized spherical harmonic expansion of the Boltzmann equation, Solid-State Electron., vol. 38, no. 8, pp. 1485-1495, 1995.
    • Solid-State Electron.
    • Hennacy, K.A.1    Wu, Y.J.2    Goldsman, N.3    Meiergoyz, I.D.4
  • 4
    • 0001961963 scopus 로고    scopus 로고
    • Multidimensional spherical harmonics expansion of Boltzmann equation for transport in semiconductors, vol. 5, no. 3, pp. 85-90, 1992.
    • D. Ventura, A. Gnudi, and G. Baccarani, Multidimensional spherical harmonics expansion of Boltzmann equation for transport in semiconductors, Appl. Math. Lett., vol. 5, no. 3, pp. 85-90, 1992.
    • Appl. Math. Lett.
    • Ventura, D.1    Gnudi, A.2    Baccarani, G.3
  • 5
    • 0027576244 scopus 로고    scopus 로고
    • Two-dimensional MOSFET simulation by means of a multidimensional spherical harmonics expansion of the Boltzmann transport equation, vol. 36, no. 4, pp. 575-581, 1993.
    • A. Gnudi, D. Ventura, G. Baccarani, and F. Odeh, Two-dimensional MOSFET simulation by means of a multidimensional spherical harmonics expansion of the Boltzmann transport equation, Solid-State Electron., vol. 36, no. 4, pp. 575-581, 1993.
    • Solid-State Electron.
    • Gnudi, A.1    Ventura, D.2    Baccarani, G.3    Odeh, F.4
  • 6
    • 51249167887 scopus 로고    scopus 로고
    • A deterministic approach to the solution of the BTE in semiconductors, vol. 18, no. 6, pp. 1-33, 1995.
    • D. Ventura, A. Gnudi, and G. Baccarani, A deterministic approach to the solution of the BTE in semiconductors, La Rivista del Nuovo Cimenta, vol. 18, no. 6, pp. 1-33, 1995.
    • La Rivista Del Nuovo Cimenta
    • Ventura, D.1    Gnudi, A.2    Baccarani, G.3
  • 7
    • 33747652845 scopus 로고    scopus 로고
    • An Efficient Method For Evaluating The Energy Distribution Of Electrons In Semiconductors Based On The Spherical Harmonics Expansion
    • vol. 75-C, no. 2, pp. 194-199, 1992.
    • _, An efficient method for evaluating the energy distribution of electrons in semiconductors based on the spherical harmonics expansion, IEICE Trans. Electron., vol. 75-C, no. 2, pp. 194-199, 1992.
    • IEICE Trans. Electron.
  • 8
    • 84983227767 scopus 로고    scopus 로고
    • Incorporating full band-structure effects in the spherical-harmonics expansion of the Boltzmann transport equation, in 1994, pp. 55-58.
    • M. C. Vecchi, D. Ventura, A. Gnudi, and G. Baccarani, Incorporating full band-structure effects in the spherical-harmonics expansion of the Boltzmann transport equation, in Proc. NUPAD V Conf., 1994, pp. 55-58.
    • Proc. NUPAD v Conf.
    • Vecchi, M.C.1    Ventura, D.2    Gnudi, A.3    Baccarani, G.4
  • 9
    • 33747666688 scopus 로고    scopus 로고
    • Res. Rpt. RC 20130, Tech. Rep., IBM, Yorktown Heights, NY, July 1995.
    • S. F. Laux and M. V. Fischetti, Res. Rpt. RC 20130, Tech. Rep., IBM, Yorktown Heights, NY, July 1995.
    • Laux, S.F.1    Fischetti, M.V.2
  • 10
    • 0027697831 scopus 로고    scopus 로고
    • Modeling impact ionization in a BJT by means of a spherical harmonics expansion of the Boltzmann transport equation, in vol. 12, pp. 1706-1713, Nov. 1993.
    • A. Gnudi, D. Ventura, and G. Baccarani, Modeling impact ionization in a BJT by means of a spherical harmonics expansion of the Boltzmann transport equation, in IEEE Trans. Computer-Aided Design, vol. 12, pp. 1706-1713, Nov. 1993.
    • IEEE Trans. Computer-Aided Design
    • Gnudi, A.1    Ventura, D.2    Baccarani, G.3
  • 11
    • 0027663572 scopus 로고    scopus 로고
    • A numerical method to compute isotropic band models from anisotropic semiconductor band structures, vol. 12, pp. 1327-1336, Sept. 1993.
    • A. Abramo, F. Venturi, E. Sangiorgi, J. Higman, and B. Riccò, A numerical method to compute isotropic band models from anisotropic semiconductor band structures, IEEE Trans. Computer-Aided Design, vol. 12, pp. 1327-1336, Sept. 1993.
    • IEEE Trans. Computer-Aided Design
    • Abramo, A.1    Venturi, F.2    Sangiorgi, E.3    Higman, J.4    Riccò, B.5
  • 12
    • 35949009958 scopus 로고    scopus 로고
    • Monte-Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects, vol. 38, p. 9721, 1988.
    • M. V. Fischetti and S. E. Laux, Monte-Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects, Phys. Rev. B, vol. 38, p. 9721, 1988.
    • Phys. Rev. B
    • Fischetti, M.V.1    Laux, S.E.2
  • 14
    • 35949025517 scopus 로고    scopus 로고
    • The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials, vol. 55, p. 645, 1983.
    • C. Jacoboni and E. Reggiani, The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials, Rev. Mod. Phys., vol. 55, p. 645, 1983.
    • Rev. Mod. Phys.
    • Jacoboni, C.1    Reggiani, E.2
  • 16
    • 85034187142 scopus 로고    scopus 로고
    • Full-band Monte Carlo simulation of high-energy transport and impact ionization of electrons and holes in Ge, Si, and GaAs, in
    • M. V. Fischetti, N. Sano, S. E. Laux, and K. Natori, Full-band Monte Carlo simulation of high-energy transport and impact ionization of electrons and holes in Ge, Si, and GaAs, in Proc. SISPAD Conf., 1996.
    • Proc. SISPAD Conf., 1996.
    • Fischetti, M.V.1    Sano, N.2    Laux, S.E.3    Natori, K.4
  • 17
    • 0014778389 scopus 로고    scopus 로고
    • Measurements of the ionization rates in diffused silicon p-n junctions, vol. 13, pp. 583-608, 1970.
    • R. van Overstraeten and H. De Man, Measurements of the ionization rates in diffused silicon p-n junctions, Solid-State Electron., vol. 13, pp. 583-608, 1970.
    • Solid-State Electron.
    • Van Overstraeten, R.1    De Man, H.2
  • 18
    • 0015604280 scopus 로고    scopus 로고
    • Use of a Schottky barrier to measure impact ionization coefficient in semiconductors, vol. 16, p. 381, 1973.
    • M. H. Woods, W. C. Johnson, and M. A. Lampert, Use of a Schottky barrier to measure impact ionization coefficient in semiconductors, Solid-State Electron., vol. 16, p. 381, 1973.
    • Solid-State Electron.
    • Woods, M.H.1    Johnson, W.C.2    Lampert, M.A.3
  • 19
    • 0015673363 scopus 로고    scopus 로고
    • Electron and hole ionization rates in epitaxial silicon at high electric fields, vol. 16, p. 1189, 1973.
    • W. N. Grant, Electron and hole ionization rates in epitaxial silicon at high electric fields, Solid-State Electron., vol. 16, p. 1189, 1973.
    • Solid-State Electron.
    • Grant, W.N.1
  • 20
    • 0007702208 scopus 로고    scopus 로고
    • Effect of impact ionization on hot-carrier energy and momentum relaxation in semiconductors, vol. 20, p. E861, 1987.
    • E. Schöll and W. Quade, Effect of impact ionization on hot-carrier energy and momentum relaxation in semiconductors, J. Phys. C, Solid-State Phys., vol. 20, p. E861, 1987.
    • J. Phys. C, Solid-State Phys.
    • Schöll, E.1    Quade, W.2
  • 21
  • 22
    • 11944260710 scopus 로고    scopus 로고
    • Direct determination of impact-ionization rates near threshold in semiconductors using soft X-ray photoemission, vol. 68, no. 6, p. 831, 1992.
    • E. E. Eklund, P. D. Kirchner, D. K. Shuh, F. R. McFeely, and E. Cartier, Direct determination of impact-ionization rates near threshold in semiconductors using soft X-ray photoemission, Phys. Rev. Lett., vol. 68, no. 6, p. 831, 1992.
    • Phys. Rev. Lett.
    • Eklund, E.E.1    Kirchner, P.D.2    Shuh, D.K.3    McFeely, F.R.4    Cartier, E.5
  • 25
    • 0346427643 scopus 로고    scopus 로고
    • Measurements of electron impact ionization coefficient in bulk silicon under a low electric field, vol. 72, no. 5, pp. 1989-1992, 1992.
    • I. Takayanagi, K. Matsumoto, and J. Nakamura, Measurements of electron impact ionization coefficient in bulk silicon under a low electric field, J. Appl. Phys., vol. 72, no. 5, pp. 1989-1992, 1992.
    • J. Appl. Phys.
    • Takayanagi, I.1    Matsumoto, K.2    Nakamura, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.