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Physical Review Letters

Volumn 68, Issue 6, 1992, Pages 831-834

Direct determination of impact-ionization rates near threshold in semiconductors using soft-x-ray photoemission

(5) Eklund, E A a Kirchner, P D a Shuh, D K a McFeely, F R a Cartier, E a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11944260710 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.68.831 Document Type: Article

Times cited : (12)

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