Measurement of electron impact ionization coefficient in bulk silicon under a low-electric field

Journal of Applied Physics

Volumn 72, Issue 5, 1992, Pages 1989-1992

  Takayanagi, Isao ^a   Matsumoto, Kazuya ^a   Nakamura, Jun Ichi ^a  

^a OLYMPUS CORPORATION   (Japan)

Author keywords

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Indexed keywords

EID: 0346427643     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.351625     Document Type: Article

References (7)