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Volumn 44, Issue 6 PART 1, 1997, Pages 1862-1869

Integrity of III-V heterojunction interfaces under gamma irradiation

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; GAMMA RAYS; INTERFACES (MATERIALS); IRRADIATION; PHOTOLUMINESCENCE; RADIATION DAMAGE; VOLTAGE MEASUREMENT;

EID: 0031387251     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658954     Document Type: Article
Times cited : (1)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.