Measurement of band offset of a strained-layer single quantum well by a capacitance-voltage technique

Journal of Applied Physics

Volumn 74, Issue 12, 1993, Pages 7618-7620

  Subramanian, S ^a   Arora, B M ^a   Srivastava, A K ^a   Fernandes, G ^a   Banerjee, S ^a  

^a TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

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EID: 0012593041     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.354941     Document Type: Article

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