Measurement of isotype heterojunction barriers by C-V profiling

Applied Physics Letters

Volumn 36, Issue 4, 1980, Pages 295-297

  Kroemer, H ^a   Chien, Wu Yi ^a   Harris Jr , J S ^b   Edwall, D D ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Rockwell International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36749112777     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.91467     Document Type: Article

References (6)