Scanning tunneling microscopy study of SiC(0001) surface reconstructions

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 933-937

  Owman, Fredrik ^a   Mårtensson, Per ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001634215     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589178     Document Type: Article

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