A novel on-chip electrostatic discharge (esd) protection with common discharge line for high-speed cmos lsi's

IEEE Transactions on Electron Devices

Volumn 44, Issue 7, 1997, Pages 1124-1130

  Narita, Kaoru ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS;

ELECTROSTATIC DISCHARGE PROTECTION;

CMOS INTEGRATED CIRCUITS;

EID: 0031176814     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.595940     Document Type: Article

References (17)

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