Output ESD protection techniques for advanced CMOS processes

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1988, Pages 206-211

  Duvvury, C ^a   Rountree, R ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES--STATIC ELECTRICITY; ELECTROSTATICS;

BURIED DIFFUSION STRUCTURE; CMOS BUFFERS; ELECTROSTATIC DISCHARGE (ESD); OUTPUT ESD PROTECTION TECHNIQUES;

SEMICONDUCTOR DEVICES, MOS;

EID: 0024171636     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)