ESD PROTECTION RELIABILITY IN 1 mu M CMOS TECHNOLOGIES.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1986, Pages 199-205

  Duvvury, C ^a   McPhee, R A ^a   Baglee, D A ^a   Rountree, R N ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; RELIABILITY;

ELECTROMIGRATION; ELECTROSTATIC DISCHARGE; FAILURE MODES;

SEMICONDUCTOR DEVICES, MOS;

EID: 0022563531     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)