ESD: A Pervasive Reliability Concern for IC Technologies

Proceedings of the IEEE

Volumn 81, Issue 5, 1993, Pages 690-702

  Duvvury, Charvaka ^a   Amerasekera, Ajith ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC DISCHARGES; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; RELIABILITY;

BICMOS; ELECTROSTATIC DISCHARGES; ESD FAILURE PHYSICS; IC PROTECTION CIRCUITS;

ELECTROSTATICS;

EID: 0027593474     PISSN: 00189219     EISSN: 15582256     Source Type: Journal    
DOI: 10.1109/5.220901     Document Type: Article

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