Novel clamp circuits for IC power supply protection

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1995, Pages 1-12

  Maloney, Timothy J ^a   Dabral, Sanjay ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; ELECTROSTATICS; HIGH TEMPERATURE EFFECTS; LEAKAGE CURRENTS; SUBSTRATES; TRANSISTORS;

CLAMP CIRCUITS; ELECTROSTATIC DISCHARGE; LOW VOLTAGE CONDUCTION; PIN COMBINATIONS; POWER SUPPLY OVERVOLTAGES;

POWER SUPPLY CIRCUITS;

EID: 0029476615     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/eosesd.1995.478262     Document Type: Conference Paper

References (19)