New ESD protection concept for VLSI CMOS circuits avoiding circuit stress

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1991, Pages 74-82

  Guggenmos, X ^a   Holzner, R ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS--ELECTRIC CHARGE; INTEGRATED CIRCUITS, CMOS;

ESD HARDNESS; ESD PROTECTION;

INTEGRATED CIRCUITS, VLSI;

EID: 0026381814     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)