Hot carrier effects in flash

Microelectronic Engineering

Volumn 36, Issue 1-4, 1997, Pages 277-284

  Eitan, Boaz ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CELLULAR ARRAYS; COMPUTER PROGRAMMING; ELECTRON TUNNELING; HOT CARRIERS; LOGIC GATES; NAND CIRCUITS; NONVOLATILE STORAGE; RANDOM ACCESS STORAGE; SEMICONDUCTOR STORAGE; COMPUTER SIMULATION; GATES (TRANSISTOR); MONTE CARLO METHODS; QUANTUM THEORY; TECHNOLOGICAL FORECASTING;

CHANNEL HOT ELECTRON (CHE) PROGRAMMING; FLASH MEMORY; FOWLER NORDHEIM TUNNELING; MULTIBIT CELL; FLASH MEMORY DEVICES;

PROM; ROM;

EID: 0031150259     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-9317(97)00063-4     Document Type: Article

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